Oxford Instruments

– 𝗝𝘂𝗽𝗶𝘁𝗲𝗿 𝗗𝗶𝘀𝗰𝗼𝘃𝗲𝗿𝘆 𝗔𝗙𝗠 – Launch Day – 🚀

We’re excited to introduce the new Jupiter Discovery Atomic Force Microscope.
This next-generation large-sample AFM delivers best-in-class performance combined with exceptional ease of use.

🔹Simplified Workflow for Maximum Productivity
Pre-mounted probes, a unique side-view camera, and exclusive FFM-Topography imaging mode with AutoPilot simplify the entire imaging workflow.

🔹Next-Generation Design for Ultimate Performance
Jupiter Discovery achieves ultra-high resolution and scan rates 5-20x faster than other large-sample AFMs to set a new benchmark in its segment.

🔹Unmatched Configurability for Meeting Diverse Challenges
A vast selection of accessories and capabilities enables multidisciplinary research, while configuration options help span a wider range of research budgets.

𝗗𝗶𝘀𝗰𝗼𝘃𝗲𝗿 𝗡𝗲𝘅𝘁-𝗚𝗲𝗻𝗲𝗿𝗮𝘁𝗶𝗼𝗻 𝗔𝗙𝗠 𝗣𝗲𝗿𝗳𝗼𝗿𝗺𝗮𝗻𝗰𝗲, 𝗳𝗼𝗿 𝗘𝘃𝗲𝗿𝘆𝗼𝗻𝗲:
https://okt.to/XYAIWo

Image 1: Jupiter Discovery; Image 2: Pre-mounted probe; Image 3: Side-view camera image; Image 4: Silicon photonics waveguide structures imaged using FFM-Topography with AutoPilot mode, 18 µm scan size; Image 5: Silicon carbide substrate with 0.75 nm steps. Imaged using FFM-Topography with AutoPilot mode, 5 µm scan size

Join us on 27 & 28 March at Salon Forum LABO in Lyon, France, and discover our latest product innovations.

Our team at booth n. E44 is looking forward to telling you all about our solutions in scanning electron microscopy ( ), imaging, spectroscopy and atomic force microscopy ( ).

Understanding the structure and properties of a material is fundamental to understanding its characteristics and improving its performance. Our materials analysis solutions enable you to accurately analyse and characterise materials down to the nanoscale level more rapidly.

👉 https://okt.to/e3o74P