MFG Vision Limited
yieldHub Ltd provides Yield Management and Data Analysis software solutions to semiconductor companies and foundries. We have customers and agents worldwide.
16/12/2019
Testing In Context Gaining Ground
Why simple pass/fail testing no longer works.
Testing In Context Gaining Ground Why simple pass/fail testing no longer works.
10/12/2019
yieldHUB's most read articles 2019
As it’s that time of year for reflecting and looking back, we thought we’d share our most popular articles of 2019
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29/10/2019
Do you need support for your software?
Today, Kevin Robinson, Director of Customer Success in yieldHUB explores this topic.
Do you need support for your software? Let’s look at 3 scenarios to explore the question. Using software that is single version Using software that is developed in house Using Software as a Service. These are not the only models or cases out there but will allow
30/09/2019
STDF Webinar
Would you like to learn more about STDF? Then join us for our webinar in October. There are three time slots available, you can attend whichever one is best for you. Register today.
STDF webinar Join us for a webinar on STDF, Standard Test Data Format, the most common tester datalog format in the semiconductor industry. The webinar will take place on October 22nd, 14:30 GMT, 18:30 GMT, and October 23rd 07:00 GMT. Register below, and you can attend whichever session suits
26/09/2019
What is the value of Part Average Testing (PAT)?
More and more, we are seeing a need for improved quality, reliability and transparency across the industry. There used to be some-tolerance for defects in the semiconductor industry. But we’re seeing a zero tolerance approach in the automotive industry and in many other industries too.
For example, if a consumer buys an expensive smartphone and it stops working sooner than expected, they are more likely to lose trust and switch brands permanently. By investing in Outlier Detection and PAT, you increase quality and reliability. Thereby maintaining your reputation and trust with your customers and their customers.
Part Average Testing (PAT) What is Part Average Testing (PAT)? With semiconductor manufacturers producing huge amounts of data, it can be hard to guarantee quality and reliability, even with internal tools. Many companies outsource Part Average Testing (PAT) to a bespoke yield management provider. Provided they meet the stand...
09/09/2019
Are Lots on Hold, holding you back?
Lots on Hold cause a bottleneck in subcons. In this article, we'll explain how you can make the process easier for your team and improve on-time delivery to your customers.
Are Lots on Hold holding you back? One of the biggest bottlenecks in any Subcon is Lots on Hold. The problem occurs many times a week on most factory floors. It’s something you’ve grown to loathe or endure. But, is there something you can do to reduce the amount of time lots spend on hold? In this article, we will
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