Covalent

Thank you to all who stopped by to say hello to our Covalent team at last week! We enjoyed seeing you all and look forward to connecting with you in the future.

𝗜𝗳 𝘆𝗼𝘂 𝘄𝗼𝗿𝗸 𝘄𝗶𝘁𝗵 𝘁𝗵𝗶𝗻 𝗳𝗶𝗹𝗺𝘀, 𝘁𝗵𝗶𝘀 𝘁𝗲𝗰𝗵𝗻𝗶𝗾𝘂𝗲 𝘀𝗵𝗼𝘂𝗹𝗱 𝙙𝙚𝙛𝙞𝙣𝙞𝙩𝙚𝙡𝙮 𝗯𝗲 𝗼𝗻 𝘆𝗼𝘂𝗿 𝗿𝗮𝗱𝗮𝗿! 📡
Spectroscopic Ellipsometry is a non-destructive optical technique used for precise characterization of -films and coatings ranging from sub-nanometer up to 10s of microns thick!

In Covalent Academy's next webinar event, guest speaker Dr. Jianing Sun from J.A. Woollam will catch you up with some of the latest applications of Ellipsometry across industries including , , , and more!

Come learn the principles of this technique and find out why its popularity in R&D has been growing so rapidly in recent years.
𝗥𝗲𝗴𝗶𝘀𝘁𝗲𝗿 𝗻𝗼𝘄:

R&D Applications of Ellipsometry | Covalent Metrology This webinar covers the fundamentals of Ellipsometry and demonstrates its powerful insights for process control and property monitoring for thin films research.